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Ge-on-Si modulators operating at mid-infrared wavelengths up to 8 μm
Tiantian Li, Milos Nedeljkovic, Nannicha Hattasan, Wei Cao, Zhibo Qu, Callum G. Littlejohns, Jordi Soler Penades, Lorenzo Mastronardi, Vinita Mittal, Daniel Benedikovic, David J. Thomson, Frederic Y. Gardes, Hequan Wu, Zhiping Zhou, and Goran Z. Mashanovich
We report mid-infrared Ge-on-Si waveguide-based PIN diode modulators operating at wavelengths of 3.8 and 8 μm. Fabricated 1-mm-long electro-absorption devices exhibit a modulation depth of >35 dB with a 7 V forward bias at 3.8 μm, and a similar 1-mm-long Mach–Zehnder modulator has a Vπ·L of 0.47 V·cm. Driven by a 2.5Vpp RF signal, 60 MHz on-off keying modulation was demonstrated. Electro-absorption modulation at 8 μm was demonstrated preliminarily, with the device performance limited by large contact separation and high contact resistance. We report mid-infrared Ge-on-Si waveguide-based PIN diode modulators operating at wavelengths of 3.8 and 8 μm. Fabricated 1-mm-long electro-absorption devices exhibit a modulation depth of >35 dB with a 7 V forward bias at 3.8 μm, and a similar 1-mm-long Mach–Zehnder modulator has a Vπ·L of 0.47 V·cm. Driven by a 2.5Vpp RF signal, 60 MHz on-off keying modulation was demonstrated. Electro-absorption modulation at 8 μm was demonstrated preliminarily, with the device performance limited by large contact separation and high contact resistance.
Photonics Research
- Publication Date: Jul. 12, 2019
- Vol. 7, Issue 8, 08000828 (2019)
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